SENDIRA 中紅外光譜橢偏儀
名稱：涂鍍層測厚儀
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簡介：SENDIRA 中紅外光譜橢偏儀 廠商名稱： SENTHCH 商品名稱： 中紅外光譜橢偏儀 商品型號： SENDIRA 簡單信息： 中紅外光譜橢偏儀具有大面積水平樣品臺，馬達驅動可變入射角度，支持樣品水平掃描，吹氮氣去水蒸氣保護紅外光學透鏡...
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SENDIRA 中紅外光譜橢偏儀
廠商名稱： SENTHCH
商品名稱： 中紅外光譜橢偏儀
商品型號： SENDIRA
簡單信息： 中紅外光譜橢偏儀具有大面積水平樣品臺，馬達驅動可變入射角度，支持樣品水平掃描，吹氮氣去水蒸氣保護紅外光學透鏡。提供新材料如有機物半導體, OLED和有機物光譜范圍內振動光譜的優(yōu)良結果。提供復雜多層膜上化學、機械、電氣、光學信息。即可作為研發(fā)工具.
SE 900-50 紅外光譜橢偏儀替代型號
Basics The ellipsometer measures in reflection mode the optical response of a sample using polarized light.
The sample properties change the polarization state of the reflected light. Amplitude ratio and phase difference of the Fresnel reflection coefficients rpand rsare used to investigate material composition, molecule orientation, film thickness and optical constants of single films and layer stacks.
Benefits of SENDIRA IR spectroscopic ellipsometer
Measures two parameters: amplitude ratio and phase differences
Sensitive to mono layers and molecule orientation
Easy sample preparation, no reference sample required
Combines SE with R and T measurements
Large sample analysis, mapping capabilities
Key features
•Wavelength range: 400 cm-1–6000 cm-1
•Separate ellipsometer optics, ellipsometer uses external port of FT-IR instrument
•Complete accessible FT-IR spectrometer
•Large samples, maximal sample size 200 mm diameter, maximal sample height 8 mm
•Ellipsometric, transmission and reflection measurements with polarized light
•Variable incident angle of light (VASE)
•SENTECH comprehensive software for spectroscopic ellipsometry SpectraRay
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