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Agilet 88000 HS-100顯示器測(cè)試系統(tǒng)
名稱：其他儀器與工具
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簡(jiǎn)介：Agilet 88000 HS-100 High Speed and Sensitivity Array Test System Fast full array test technology within allotted TACT，Hi...
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Agilet 88000 HS-100 High Speed and Sensitivity Array Test System Fast full array test technology within allotted TACT，High testing sensitivity and exact defect detection，Agilet 88000 Provides the data needed for efficient process feedback and product cost reduction
Agilet 88000主要特性與技術(shù)指標(biāo) Product Benefits
•Fast full array test technology within allotted TACT
•High testing sensitivity and exact defect detection
•Provides the data needed for efficient process feedback and product cost reduction
•Adapts to new FPD technology, including AM-OLED and SOG
Agilet 88000 General Features
•Test targets : TFT arrays of LTPS LCD, HTPS LCD, and AM-OLED panels
•Number of measurement pins : Up to 2,304 pins (2 test heads with multiplexer)
•Number of multiple test sites : Up to eight
Typical Evaluation Items
•Opens, Shorts, and Opens or Shorts between lines
•Cs and Charge in pixel
•Ion, Ioff, Vth, and OLED driver transistor
•Shift register carry-out in peripheral circuitry area
Agilet 88000 Measurement Capability
•Current measurement range: 20 uA, 2 uA, 200nA, 20 nA
•Current measurement resolution: 5 nA, 500 pA, 50 pA, 5 pA
•Charge measurement repeatability : ? = < 5 fC (equivalent to 1 fF) [supplemental characteristics]
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